UMF-Centre for Electron Microscopy (UMF-CEM)

CEM enables a wide variety of disciplinary and interdisciplinary research projects, covering topics from Optoelectronic to up-conversion, Ferroelectric to Pyroelectric, alloys to ceramics, polymers to biomaterials. CEM supports two transmission electron microscopes (JEOL-F200 & JEOL-2100F) providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS as well as an instrumentation for TEM sample preparation (PIPS-691).

CEM supports two transmission electron microscopes (JEOL-F200 & JEOL-2100F) and an instrumentation for TEM sample preparation (PIPS-691). providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS. with EBL-NPGS providing pattern writing and sample preparation, as well as .