UMF-Centre for Electron Microscopy (UMF-CEM)

CEM enables a wide variety of disciplinary and interdisciplinary research projects, covering topics from Optoelectronic to up-conversion, Ferroelectric to Pyroelectric, alloys to ceramics, polymers to biomaterials. CEM supports two transmission electron microscopes (JEOL-2011 & JEOL-2100F) providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS. A dual beam focused ion beam (FIB) microscope (JIB-4501) with EBL-NPGS providing pattern writing and sample preparation, as well as an instrumentation for TEM sample preparation (PIPS-691).

CEM supports two transmission electron microscopes (JEOL-2011 & JEOL-2100F), a dual beam focused ion beam (FIB) microscope (JIB-4501) and an instrumentation for TEM sample preparation (PIPS-691). providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS. with EBL-NPGS providing pattern writing and sample preparation, as well as .